Accelerated Testing: Statistical Models, Test Plans, and Data Analyses: Statistical Models, Test Plans, and Data Analysis (Wiley Series in Probability and Statistics) von Nelson, Wayne B. | ISBN 9780471697367

Accelerated Testing: Statistical Models, Test Plans, and Data Analyses: Statistical Models, Test Plans, and Data Analysis (Wiley Series in Probability and Statistics)

Buchcover Accelerated Testing: Statistical Models, Test Plans, and Data Analyses: Statistical Models, Test Plans, and Data Analysis (Wiley Series in Probability and Statistics) | Nelson, Wayne B. | EAN 9780471697367 | ISBN 0-471-69736-2 | ISBN 978-0-471-69736-7

Accelerated Testing: Statistical Models, Test Plans, and Data Analyses: Statistical Models, Test Plans, and Data Analysis (Wiley Series in Probability and Statistics)

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Accelerated Testing: Statistical Models, Test Plans, and Data Analyses: Statistical Models, Test Plans, and Data Analysis (Wiley Series in Probability and Statistics)

Accelerated Testing: Statistical Models, Test Plans, and Data Analyses: Statistical Models, Test Plans, and Data Analysis (Wiley Series in Probability and Statistics)

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