Reihe Science for SystemsDaniel Bruch × A Compact In-Situ Cryogenic Noise Measurement System for Characterization of Low Noise Amplifiers Daniel BruchFraunhofer VerlagSoftcover201435,00 € A Compact In-Situ Cryogenic Noise Measurement System for Characterization of Low Noise Amplifiers Daniel BruchFraunhofer VerlagSoftcover201435,00 €