Reihe Springer Series in Advanced MicroelectronicsJacopo Franco × Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications Jacopo FrancoSpringer NetherlandSoftcover2016106,99 € Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications Jacopo FrancoSpringer NetherlandHardcover2013106,99 € Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications Jacopo FrancoSpringer NetherlandeBook201396,29 €