Reihe Springer ThesesWeronika Walkosz × Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces Weronika WalkoszSpringer USSoftcover2013 Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces Weronika WalkoszSpringer USSoftcover2013 Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces Weronika WalkoszSpringer USHardcover2011 Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces Weronika WalkoszSpringer USHardcover2011 Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces Weronika WalkoszSpringer USeBook2011 Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces Weronika WalkoszSpringer USeBook2011