Advances in X-Ray Analysis

Volume 37

herausgegeben von John V. Gilfrich, C.C. Goldsmith, Ting C. Huang, Ron Jenkins und I. Cev Noyan

Mitwirkende
Herausgegeben von	John V. Gilfrich
Herausgegeben von	C.C. Goldsmith
Herausgegeben von	Ting C. Huang
Herausgegeben von	Ron Jenkins
Herausgegeben von	I. Cev Noyan

Inhaltsverzeichnis

89 articles organized under the following section heads: Impact of Computers on Xray Analysis. Applications of Whole Pattern Fitting: Structure Determination, Phase Identification, Lattice Parameters. Search/Match Methods, Phase Identification. Diffraction from Single Crystals and Epitaxial Films. Xray Characterization of Films and Surface Layers. Strain and Stress Determination, Xray Fractography, Diffraction Peak Broadening Analysis. Advances in Detectors and Counting Electronics. XRD Techniques and Instrumentation, Nonambient Applications, Texture, other Applications. Xray Optics, Monochromators and Synthetic Multilayers. Total Reflection XRF Applications and Instrumentation, other XRF Techniques and Instrumentation. Mathematical Techniques in Xray Spectrometry. Geological and other Applications of XRS. Index.