Electron Beam Ion Sources and Traps and Their Applications | 8th International Symposium EBIS/T 2000, Upton, New York, 5-8 November 2000 | ISBN 9780735400115

Electron Beam Ion Sources and Traps and Their Applications

8th International Symposium EBIS/T 2000, Upton, New York, 5-8 November 2000

herausgegeben von Krsto Prelec
Buchcover Electron Beam Ion Sources and Traps and Their Applications  | EAN 9780735400115 | ISBN 0-7354-0011-3 | ISBN 978-0-7354-0011-5
Research

Electron Beam Ion Sources and Traps and Their Applications

8th International Symposium EBIS/T 2000, Upton, New York, 5-8 November 2000

herausgegeben von Krsto Prelec
This symposium is a triennial event, held in different places around the world (next symposium will be in Japan, in 2003). The topic of the symposium is the development of electron beam ion sources and traps and their applications, so far in basic science and research, but with prospects for extending them into other areas. Potential readers would have an interest in atomic physics and applications to accelerator physics.