Nano Devices and Sensors | ISBN 9781501510502

Nano Devices and Sensors

herausgegeben von Juin J. Liou, Shien-Kuei Liaw und Yung-Hui Chung
Mitwirkende
Herausgegeben vonJuin J. Liou
Herausgegeben vonShien-Kuei Liaw
Herausgegeben vonYung-Hui Chung
Beiträge vonBillion Abraham
Beiträge vonKuan-Chang Chang
Beiträge vonTing-Chang Chang
Beiträge vonYao-Feng Chang
Beiträge vonPoki Chen
Beiträge vonShen-Li Chen
Beiträge vonYing-Chen Chen
Beiträge vonYen-Ting Chen
Beiträge vonYen-Ting Chen
Beiträge vonBurt Fowler
Beiträge vonShun-Zhao Huang
Beiträge vonYu-Ting Huang
Beiträge vonHyunsang Hwang
Beiträge vonChunsheng Jiang
Beiträge vonJack C. Lee
Beiträge vonTzung-Je Lee
Beiträge vonRenrong Liang
Beiträge vonChun-Ju Lin
Beiträge vonDmitry Osintsev
Beiträge vonAmit Prakash
Beiträge vonSiegfried Selberherr
Beiträge vonViktor Sverdlov
Beiträge vonSimon M. Sze
Beiträge vonTsung-Ming Tsai
Beiträge vonCheng-Hsun Tsai
Beiträge vonYanzhen Wang
Beiträge vonJing Wang
Beiträge vonArif Widodo
Beiträge vonChang-Hsi Wu
Beiträge vonXiaohan Wu
Beiträge vonJun Xu
Beiträge vonFei Xue
Beiträge vonChia-Wei Yen
Beiträge vonHong-Cheng You
Beiträge vonFei Zhou
Buchcover Nano Devices and Sensors  | EAN 9781501510502 | ISBN 1-5015-1050-9 | ISBN 978-1-5015-1050-2

Nano Devices and Sensors

herausgegeben von Juin J. Liou, Shien-Kuei Liaw und Yung-Hui Chung
Mitwirkende
Herausgegeben vonJuin J. Liou
Herausgegeben vonShien-Kuei Liaw
Herausgegeben vonYung-Hui Chung
Beiträge vonBillion Abraham
Beiträge vonKuan-Chang Chang
Beiträge vonTing-Chang Chang
Beiträge vonYao-Feng Chang
Beiträge vonPoki Chen
Beiträge vonShen-Li Chen
Beiträge vonYing-Chen Chen
Beiträge vonYen-Ting Chen
Beiträge vonYen-Ting Chen
Beiträge vonBurt Fowler
Beiträge vonShun-Zhao Huang
Beiträge vonYu-Ting Huang
Beiträge vonHyunsang Hwang
Beiträge vonChunsheng Jiang
Beiträge vonJack C. Lee
Beiträge vonTzung-Je Lee
Beiträge vonRenrong Liang
Beiträge vonChun-Ju Lin
Beiträge vonDmitry Osintsev
Beiträge vonAmit Prakash
Beiträge vonSiegfried Selberherr
Beiträge vonViktor Sverdlov
Beiträge vonSimon M. Sze
Beiträge vonTsung-Ming Tsai
Beiträge vonCheng-Hsun Tsai
Beiträge vonYanzhen Wang
Beiträge vonJing Wang
Beiträge vonArif Widodo
Beiträge vonChang-Hsi Wu
Beiträge vonXiaohan Wu
Beiträge vonJun Xu
Beiträge vonFei Xue
Beiträge vonChia-Wei Yen
Beiträge vonHong-Cheng You
Beiträge vonFei Zhou

The chapters in this edited book are written by some authors who have presented very high quality papers at the 2015 International Symposium of Next-Generation Electronics (ISNE 2015) held in Taipei, Taiwan. The ISNE 2015 was intended to provide a common forum for researchers, scientists, engineers, and practitioners throughout the world to present their latest research findings, ideas, developments, and applications in the general areas of electron devices, integrated circuits, and microelectronic systems and technologies. The scope of the conference includes the following topics:

A. Green Electronics
B. Microelectronic Circuits and Systems
C. Integrated Circuits and Packaging Technologies
D. Computer and Communication Engineering

E. Electron Devices

F. Optoelectronic and Semiconductor Technologies

The technical program consisted of 4 plenary talks, 23 invited talks, and more than 250 contributed oral and poster presentations. Plenary speakers were recognized experts in their fields, and their talks focused on leading-edge technologies including:

„The Future Lithographic Technology for Semiconductor Fabrication“ by Dr. Alek C. Chen, Asia ASML, Taiwan.

„Detection of Single Traps and Characterization of Individual Traps: Beginning of Atomistic Reliability Physics“ by Prof. Toshiaki Tsuchiya, Shimane University, Japan.

„The Art and Science of Packaging High-Coupling Photonics Devices and Modules“, by Prof. Wood-Hi Cheng, National Chung-Hsing University, Taiwan.

„Prospect and Outlook of Electrostatic Discharge (ESD) Protection in Emerging Technologies“, by Prof. Juin J. Liou, University of Central Florida, USA.

After a rigorous review process, the ISNE 2015 technical program committee has selected 10 outstanding presentations and invited the authors to prepare extended chapters for inclusion in this edited book. Of the 10 chapters, five are focused on the subject of electronic devices, and the other covers the circuit designs for various applications. The authors are working at the academia in Austria, United States, Korea, and Taiwan.

The guest editors would like to take this opportunity to express our sincere gratitude to all the members of the ISNE 2015 technical program committees for reviewing the papers and selecting the manuscripts for the edited book. We also thank all the authors for their valuable and excellent contributions to the book.