Reliability of MEMS | Testing of Materials and Devices | ISBN 9783527314942

Reliability of MEMS

Testing of Materials and Devices

herausgegeben von Osamu Tabata und Toshiyuki Tsuchiya
Mitwirkende
Reihe herausgegeben vonOliver Brand
Reihe herausgegeben vonGary K. Fedder
Reihe herausgegeben vonChristofer Hierold
Reihe herausgegeben vonJan G. Korvink
Herausgegeben vonOsamu Tabata
Herausgegeben vonToshiyuki Tsuchiya
Buchcover Reliability of MEMS  | EAN 9783527314942 | ISBN 3-527-31494-6 | ISBN 978-3-527-31494-2

Reliability of MEMS

Testing of Materials and Devices

herausgegeben von Osamu Tabata und Toshiyuki Tsuchiya
Mitwirkende
Reihe herausgegeben vonOliver Brand
Reihe herausgegeben vonGary K. Fedder
Reihe herausgegeben vonChristofer Hierold
Reihe herausgegeben vonJan G. Korvink
Herausgegeben vonOsamu Tabata
Herausgegeben vonToshiyuki Tsuchiya
This first book to cover exclusively and in detail the principles, tools and methods for determining the reliability of microelectromechanical materials, components and devices covers both component materials as well as entire MEMS devices. Divided into two major parts, following a general introductory chapter to reliability issues, the first part looks at the mechanical properties of the materials used in MEMS, explaining in detail the necessary measuring technologies -- nanoindenters, bulge methods, bending tests, tensile tests, and others. Part Two treats the actual devices, organized by important device categories such as pressure sensors, inertial sensors, RF MEMS, and optical MEMS.