CCD Image Sensors in Deep-Ultraviolet von Flora Li | Degradation Behavior and Damage Mechanisms | ISBN 9783540226802

CCD Image Sensors in Deep-Ultraviolet

Degradation Behavior and Damage Mechanisms

von Flora Li und Arokia Nathan
Mitwirkende
Autor / AutorinFlora Li
Autor / AutorinArokia Nathan
Buchcover CCD Image Sensors in Deep-Ultraviolet | Flora Li | EAN 9783540226802 | ISBN 3-540-22680-X | ISBN 978-3-540-22680-2

CCD Image Sensors in Deep-Ultraviolet

Degradation Behavior and Damage Mechanisms

von Flora Li und Arokia Nathan
Mitwirkende
Autor / AutorinFlora Li
Autor / AutorinArokia Nathan

As the deep-ultraviolet (DUV) laser technology continues to mature, an increasing number of industrial and manufacturing applications are emerging. For example, the new generation of semiconductor inspection systems is being pushed to image at increasingly shorter DUV wavelengths to facilitate inspection of deep sub-micron features in integrated circuits. DUV-sensitive charge-coupled device (CCD) cameras are in demand for these applications. Although CCD cameras that are responsive at DUV wavelengths are now available, their long-term stability is still a major concern. This book describes the degradation mechanisms and long-term performance of CCDs in the DUV, along with new results of device performance at these wavelengths.