Lock-in Thermography von Otwin Breitenstein | Basics and Use for Evaluating Electronic Devices and Materials | ISBN 9783642077852

Lock-in Thermography

Basics and Use for Evaluating Electronic Devices and Materials

von Otwin Breitenstein, Wilhelm Warta und Martin Langenkamp
Mitwirkende
Autor / AutorinOtwin Breitenstein
Autor / AutorinWilhelm Warta
Autor / AutorinMartin Langenkamp
Buchcover Lock-in Thermography | Otwin Breitenstein | EAN 9783642077852 | ISBN 3-642-07785-4 | ISBN 978-3-642-07785-2
Research

Lock-in Thermography

Basics and Use for Evaluating Electronic Devices and Materials

von Otwin Breitenstein, Wilhelm Warta und Martin Langenkamp
Mitwirkende
Autor / AutorinOtwin Breitenstein
Autor / AutorinWilhelm Warta
Autor / AutorinMartin Langenkamp
This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.