Resonant X-Ray Scattering in Correlated Systems | ISBN 9783662571224

Resonant X-Ray Scattering in Correlated Systems

herausgegeben von Youichi Murakami und Sumio Ishihara
Mitwirkende
Herausgegeben vonYouichi Murakami
Herausgegeben vonSumio Ishihara
Buchcover Resonant X-Ray Scattering in Correlated Systems  | EAN 9783662571224 | ISBN 3-662-57122-6 | ISBN 978-3-662-57122-4

Resonant X-Ray Scattering in Correlated Systems

herausgegeben von Youichi Murakami und Sumio Ishihara
Mitwirkende
Herausgegeben vonYouichi Murakami
Herausgegeben vonSumio Ishihara

The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown.