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Efficiency and Applications of SAT-Based Test Pattern Generation - Complex fault models and optimisation problems.
Design, Test and Verification of Embedded Systems Vol. 3
von Alexander Czutro39 Abb., 39Tab.
Efficiency and Applications of SAT-Based Test Pattern Generation - Complex fault models and optimisation problems. von Alexander Czutro | Design, Test and Verification of Embedded Systems Vol. 3 | ISBN 9783862473885
Efficiency and Applications of SAT-Based Test Pattern Generation - Complex fault models and optimisation problems.
Design, Test and Verification of Embedded Systems Vol. 3
von Alexander Czutro