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A Reliable Optimisation-based Model Parameter Extraction von Wilfred N Mwema | Approach for GaAS-based Field-Effect Transistors using Measurement-correlated Parameter Starting Values | ISBN 9783933146946
A Reliable Optimisation-based Model Parameter Extraction
Approach for GaAS-based Field-Effect Transistors using Measurement-correlated Parameter Starting Values
von Wilfred N Mwema