Defects and Impurities in Silicon Materials | An Introduction to Atomic-Level Silicon Engineering | ISBN 9784431557999

Defects and Impurities in Silicon Materials

An Introduction to Atomic-Level Silicon Engineering

herausgegeben von Yutaka Yoshida und Guido Langouche
Mitwirkende
Herausgegeben vonYutaka Yoshida
Herausgegeben vonGuido Langouche
Buchcover Defects and Impurities in Silicon Materials  | EAN 9784431557999 | ISBN 4-431-55799-7 | ISBN 978-4-431-55799-9

Defects and Impurities in Silicon Materials

An Introduction to Atomic-Level Silicon Engineering

herausgegeben von Yutaka Yoshida und Guido Langouche
Mitwirkende
Herausgegeben vonYutaka Yoshida
Herausgegeben vonGuido Langouche

This book emphasizes the importance of the fascinating atomistic insights into the defects and the impurities as well as the dynamic behaviors in silicon materials, which have become more directly accessible over the past 20 years. Such progress has been made possible by newly developed experimental methods, first principle theories, and computer simulation techniques. 
The book is aimed at young researchers, scientists, and technicians in related industries. The main purposes are to provide readers with 1) the basic physics behind defects in silicon materials, 2) the atomistic modeling as well as the characterization techniques related to defects and impurities in silicon materials, and 3) an overview of the wide range of the research fields involved.