Design, Analysis and Test of Logic Circuits Under Uncertainty von Smita Krishnaswamy | ISBN 9789048196432

Design, Analysis and Test of Logic Circuits Under Uncertainty

von Smita Krishnaswamy, Igor L. Markov und John P. Hayes
Mitwirkende
Autor / AutorinSmita Krishnaswamy
Autor / AutorinIgor L. Markov
Autor / AutorinJohn P. Hayes
Buchcover Design, Analysis and Test of Logic Circuits Under Uncertainty | Smita Krishnaswamy | EAN 9789048196432 | ISBN 90-481-9643-4 | ISBN 978-90-481-9643-2

Design, Analysis and Test of Logic Circuits Under Uncertainty

von Smita Krishnaswamy, Igor L. Markov und John P. Hayes
Mitwirkende
Autor / AutorinSmita Krishnaswamy
Autor / AutorinIgor L. Markov
Autor / AutorinJohn P. Hayes
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.