Event-Triggered Active Disturbance Rejection Control von Dawei Shi | Theory and Applications | ISBN 9789811602955

Event-Triggered Active Disturbance Rejection Control

Theory and Applications

von Dawei Shi, Yuan Huang, Junzheng Wang und Ling Shi
Mitwirkende
Autor / AutorinDawei Shi
Autor / AutorinYuan Huang
Autor / AutorinJunzheng Wang
Autor / AutorinLing Shi
Buchcover Event-Triggered Active Disturbance Rejection Control | Dawei Shi | EAN 9789811602955 | ISBN 981-16-0295-6 | ISBN 978-981-16-0295-5
“Through this book, readers can understand their active research ideas, the latest research status in this field, including hot issues and the latest research results. Overall, this book is well structured, clear and a worthwhile reference for readers.” (Xunlin Zhu, Mathematical Reviews, July, 2022)

Event-Triggered Active Disturbance Rejection Control

Theory and Applications

von Dawei Shi, Yuan Huang, Junzheng Wang und Ling Shi
Mitwirkende
Autor / AutorinDawei Shi
Autor / AutorinYuan Huang
Autor / AutorinJunzheng Wang
Autor / AutorinLing Shi

The past few years have seen the attention and rapid developments in event-triggered sampled-data systems, in which the effect of event-triggered sensor measurements and controller updates is explored in controller analysis and design.
This book offers the first systematic treatment of event-triggered sampled-data control system design using active disturbance rejection control (ADRC), an effective approach that is popular in both theoretic research and industrial applications. Extensive application examples with numerous illustrations are included to show how the event-triggered ADRC with theoretic performance guarantees can be implemented in engineering systems and how the performance can be actually achieved. For theoretic researchers and graduate students, the presented results provide new directions in theoretic research on event-triggered sampled-data systems; for control practitioners, the book offers an effective approach to achieving satisfactory performance with limited sampling rates.