Substrate Noise | Analysis and Optimization for IC Design | ISBN 9780306481710

Substrate Noise

Analysis and Optimization for IC Design

herausgegeben von Edoardo Charbon, Ranjit Gharpurey, Paolo Miliozzi, Robert G. Meyer und Alberto L. Sangiovanni-Vincentelli
Mitwirkende
Herausgegeben vonEdoardo Charbon
Herausgegeben vonRanjit Gharpurey
Herausgegeben vonPaolo Miliozzi
Herausgegeben vonRobert G. Meyer
Herausgegeben vonAlberto L. Sangiovanni-Vincentelli
Buchcover Substrate Noise  | EAN 9780306481710 | ISBN 0-306-48171-5 | ISBN 978-0-306-48171-0

Substrate Noise

Analysis and Optimization for IC Design

herausgegeben von Edoardo Charbon, Ranjit Gharpurey, Paolo Miliozzi, Robert G. Meyer und Alberto L. Sangiovanni-Vincentelli
Mitwirkende
Herausgegeben vonEdoardo Charbon
Herausgegeben vonRanjit Gharpurey
Herausgegeben vonPaolo Miliozzi
Herausgegeben vonRobert G. Meyer
Herausgegeben vonAlberto L. Sangiovanni-Vincentelli

In the past decade, substrate noise has had a constant and significant impact on the design of analog and mixed-signal integrated circuits. Only recently, with advances in chip miniaturization and innovative circuit design, has substrate noise begun to plague fully digital circuits as well. To combat the effects of substrate noise, heavily over-designed structures are generally adopted, thus seriously limiting the advantages of innovative technologies.
Substrate Noise: Analysis and Optimization for IC Design addresses the main problems posed by substrate noise from both an IC and a CAD designer perspective. The effects of substrate noise on performance in digital, analog, and mixed-signal circuits are presented, along with the mechanisms underlying noise generation, injection, and transport. Popular solutions to the substrate noise problem and the trade-offs often debated by designers are extensively discussed. Non-traditional approaches as well as semi-automated techniques to combat substrate noise are also addressed.
Substrate Noise: Analysis and Optimization for IC Design will be of interest to researchers and professionals interested in signal integrity, as well as to mixed signal and RF designers.