Reliability Wearout Mechanisms in Advanced CMOS Technologies von Alvin W. Strong | ISBN 9780470455258

Reliability Wearout Mechanisms in Advanced CMOS Technologies

von Alvin W. Strong und weiteren
Mitwirkende
Autor / AutorinAlvin W. Strong
Autor / AutorinErnest Y. Wu
Autor / AutorinRolf-Peter Vollertsen
Autor / AutorinJordi Sune
Autor / AutorinGiuseppe La Rosa
Autor / AutorinTimothy D. Sullivan
Autor / AutorinStewart E. Rauch
Buchcover Reliability Wearout Mechanisms in Advanced CMOS Technologies | Alvin W. Strong | EAN 9780470455258 | ISBN 0-470-45525-X | ISBN 978-0-470-45525-8

Reliability Wearout Mechanisms in Advanced CMOS Technologies

von Alvin W. Strong und weiteren
Mitwirkende
Autor / AutorinAlvin W. Strong
Autor / AutorinErnest Y. Wu
Autor / AutorinRolf-Peter Vollertsen
Autor / AutorinJordi Sune
Autor / AutorinGiuseppe La Rosa
Autor / AutorinTimothy D. Sullivan
Autor / AutorinStewart E. Rauch
This invaluable resource tells the complete story of failure mechanisms--from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. It also offers the first reference book with all relevant physics, equations, and step-by-step procedures for CMOS technology reliability in one place. Practical appendices provide basic experimental procedures that include experiment design, performing stressing in the laboratory, data analysis, reliability projections, and interpreting projections.