Atomic Layer Deposition von Tommi Kääriäinen | Principles, Characteristics, and Nanotechnology Applications | ISBN 9781118747421

Atomic Layer Deposition

Principles, Characteristics, and Nanotechnology Applications

von Tommi Kääriäinen, David Cameron, Marja-Leena Kääriäinen und Arthur Sherman
Mitwirkende
Autor / AutorinTommi Kääriäinen
Autor / AutorinDavid Cameron
Autor / AutorinMarja-Leena Kääriäinen
Autor / AutorinArthur Sherman
Buchcover Atomic Layer Deposition | Tommi Kääriäinen | EAN 9781118747421 | ISBN 1-118-74742-9 | ISBN 978-1-118-74742-1

Atomic Layer Deposition

Principles, Characteristics, and Nanotechnology Applications

von Tommi Kääriäinen, David Cameron, Marja-Leena Kääriäinen und Arthur Sherman
Mitwirkende
Autor / AutorinTommi Kääriäinen
Autor / AutorinDavid Cameron
Autor / AutorinMarja-Leena Kääriäinen
Autor / AutorinArthur Sherman
Since the first edition was published in 2008, Atomic Layer Deposition (ALD) has emerged as a powerful, and sometimes preferred, deposition technology. The new edition of this groundbreaking monograph is the first text to review the subject of ALD comprehensively from a practical perspective. It covers ALD's application to microelectronics (MEMS) and nanotechnology; many important new and emerging applications; thermal processes for ALD growth of nanometer thick films of semiconductors, oxides, metals and nitrides; and the formation of organic and hybrid materials.