Strain Effect in Semiconductors von Yongke Sun | Theory and Device Applications | ISBN 9781441905529

Strain Effect in Semiconductors

Theory and Device Applications

von Yongke Sun, Scott E. Thompson und Toshikazu Nishida
Mitwirkende
Autor / AutorinYongke Sun
Autor / AutorinScott E. Thompson
Autor / AutorinToshikazu Nishida
Buchcover Strain Effect in Semiconductors | Yongke Sun | EAN 9781441905529 | ISBN 1-4419-0552-9 | ISBN 978-1-4419-0552-9

Strain Effect in Semiconductors

Theory and Device Applications

von Yongke Sun, Scott E. Thompson und Toshikazu Nishida
Mitwirkende
Autor / AutorinYongke Sun
Autor / AutorinScott E. Thompson
Autor / AutorinToshikazu Nishida
Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. Discusses relevant applications of strain while also focusing on the fundamental physics pertaining to bulk, planar, and scaled nano-devices. Hence, this book is relevant for current strained Si logic technology as well as for understanding the physics and scaling for future strained nano-scale devices.