Precision Landmark Location for Machine Vision and Photogrammetry von José A. Gutierrez | Finding and Achieving the Maximum Possible Accuracy | ISBN 9781846289132

Precision Landmark Location for Machine Vision and Photogrammetry

Finding and Achieving the Maximum Possible Accuracy

von José A. Gutierrez und Brian S.R. Armstrong
Mitwirkende
Autor / AutorinJosé A. Gutierrez
Autor / AutorinBrian S.R. Armstrong
Buchcover Precision Landmark Location for Machine Vision and Photogrammetry | José A. Gutierrez | EAN 9781846289132 | ISBN 1-84628-913-0 | ISBN 978-1-84628-913-2
Leseprobe

Precision Landmark Location for Machine Vision and Photogrammetry

Finding and Achieving the Maximum Possible Accuracy

von José A. Gutierrez und Brian S.R. Armstrong
Mitwirkende
Autor / AutorinJosé A. Gutierrez
Autor / AutorinBrian S.R. Armstrong

The applications of image-based measurement are many and various: image-guided surgery, mobile-robot navigation, component alignment and photogrammetry, among others.

This book addresses the problem of measurement error associated with determining the location of landmarks in images. The least possible photogrammetric uncertainty in a given situation is determined using the Cramér–Rao Lower Bound (CRLB).

This monograph provides the reader with: the most complete treatment to date of precision landmark location and the engineering aspects of image capture and processing; detailed theoretical treatment of the CRLB; a software tool for analyzing the potential performance-specific camera/lens/algorithm configurations; two novel algorithms which achieve precision very close to the CRLB; a method for determining the accuracy of landmark location; a downloadable MATLAB® package to assist the reader with applying theoretically-derived results to practical engineering configurations.