System Dependability and Analytics | Approaching System Dependability from Data, System and Analytics Perspectives | ISBN 9783031020636

System Dependability and Analytics

Approaching System Dependability from Data, System and Analytics Perspectives

herausgegeben von Long Wang, Karthik Pattabiraman, Catello Di Martino, Arjun Athreya und Saurabh Bagchi
Mitwirkende
Herausgegeben vonLong Wang
Herausgegeben vonKarthik Pattabiraman
Herausgegeben vonCatello Di Martino
Herausgegeben vonArjun Athreya
Herausgegeben vonSaurabh Bagchi
Buchcover System Dependability and Analytics  | EAN 9783031020636 | ISBN 3-031-02063-4 | ISBN 978-3-031-02063-6

System Dependability and Analytics

Approaching System Dependability from Data, System and Analytics Perspectives

herausgegeben von Long Wang, Karthik Pattabiraman, Catello Di Martino, Arjun Athreya und Saurabh Bagchi
Mitwirkende
Herausgegeben vonLong Wang
Herausgegeben vonKarthik Pattabiraman
Herausgegeben vonCatello Di Martino
Herausgegeben vonArjun Athreya
Herausgegeben vonSaurabh Bagchi

This book comprises chapters authored by experts who are professors and researchers in internationally recognized universities and research institutions. The book presents the results of research and descriptions of real-world systems, services, and technologies. Reading this book, researchers, professional practitioners, and graduate students will gain a clear vision on the state of the art of the research and real-world practice on system dependability and analytics.

The book is published in honor of Professor Ravishankar K. Iyer, the George and Ann Fisher Distinguished Professor in the Department of Electrical and Computer Engineering at the University of Illinois at Urbana-Champaign (UIUC), Urbana, Illinois. Professor Iyer is ACM Fellow, IEEE Fellow, AAAS Fellow, and served as Interim Vice Chancellor of UIUC for research during 2008–2011. The book contains chapters written by many of his former students.