New Horizons of Applied Scanning Electron Microscopy von Kenichi Shimizu | ISBN 9783642031601

New Horizons of Applied Scanning Electron Microscopy

von Kenichi Shimizu und Tomoaki Mitani
Mitwirkende
Autor / AutorinKenichi Shimizu
Autor / AutorinTomoaki Mitani
Buchcover New Horizons of Applied Scanning Electron Microscopy | Kenichi Shimizu | EAN 9783642031601 | ISBN 3-642-03160-9 | ISBN 978-3-642-03160-1

From the reviews:

“The book is attractively presented, in hardcover with numerous illustrations. It is a text book doing little to disguise its academic spirit discussing its subject through a series of chapters covering the technical capabilities of FE-SEM within the materials science field. … In conclusion, a well written book of interest to experienced material scientists. The book is a relevant resource for those in academic institutions and industry segments where high resolution scanning electron microscopy is employed.” (Roland A. Fleck, Infocus Magazine, Issue 21, March, 2011)

New Horizons of Applied Scanning Electron Microscopy

von Kenichi Shimizu und Tomoaki Mitani
Mitwirkende
Autor / AutorinKenichi Shimizu
Autor / AutorinTomoaki Mitani

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.