Kelvin Probe Force Microscopy | Measuring and Compensating Electrostatic Forces | ISBN 9783642225666

Kelvin Probe Force Microscopy

Measuring and Compensating Electrostatic Forces

herausgegeben von Sascha Sadewasser und Thilo Glatzel
Mitwirkende
Herausgegeben vonSascha Sadewasser
Herausgegeben vonThilo Glatzel
Buchcover Kelvin Probe Force Microscopy  | EAN 9783642225666 | ISBN 3-642-22566-7 | ISBN 978-3-642-22566-6

Kelvin Probe Force Microscopy

Measuring and Compensating Electrostatic Forces

herausgegeben von Sascha Sadewasser und Thilo Glatzel
Mitwirkende
Herausgegeben vonSascha Sadewasser
Herausgegeben vonThilo Glatzel

Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.