Materials Modification by High-fluence Ion Beams | ISBN 9789400912670

Materials Modification by High-fluence Ion Beams

herausgegeben von Roger Kelly und M. Fernanda da Silva
Mitwirkende
Herausgegeben vonRoger Kelly
Herausgegeben vonM. Fernanda da Silva
Buchcover Materials Modification by High-fluence Ion Beams  | EAN 9789400912670 | ISBN 94-009-1267-6 | ISBN 978-94-009-1267-0

Materials Modification by High-fluence Ion Beams

herausgegeben von Roger Kelly und M. Fernanda da Silva
Mitwirkende
Herausgegeben vonRoger Kelly
Herausgegeben vonM. Fernanda da Silva

Inhaltsverzeichnis

  • Overview.
  • High-fluence ion irradiation: an overview.
  • Sputtering.
  • Historical overview on the fundamentals of sputtering.
  • Depth of origin of sputtered atoms.
  • Magnetron sputtering: physics and design.
  • On the formation and characterization of microcrystalline Si: H prepared by RF magnetron sputtering.
  • Depth profiling of Ta2O5 thin layer on Ta foil by ion scattering spectrometry and ion sputtering.
  • Bombardment of alkali and alkali-earth halides by ions and electrons.
  • Effects of Ar+ angle-of-incidence on the etching of Si with Cl2 and low-energy Ar+ ions.
  • Irradiation effects in ices by energetic ions.
  • Ion formation by very high energetic ion impact on solids.
  • Simulation.
  • Computer simulation of stopping and sputtering.
  • Computer simulation of ion-beam mixing of cobalt on silicon.
  • On the fractal nature of collision cascades.
  • Simple statistical models for erosion and growth.
  • Defects and Disorder.
  • Defects and defect processes.
  • Fast-ion-induced defects in silicon studied by deep level transient spectroscopy.
  • Low-energy (300 eV — 10 keV) Ar+ and Cl+ ion irradiation of (100) Si.
  • The charge state of iron implanted into sapphire.
  • Implantation and Mixing.
  • Direct and recoil implantation, and collisional ion-beam mixing: recent low-temperature experiments.
  • Mixing by defect-assisted migration of thin markers in solids.
  • The TRIUMF optically pumped polarized H- ion source.
  • Some high-current ion sources for materials modification.
  • Compositional and Chemical Changes.
  • Bombardment-induced compositional change with alloys, oxides, and oxysalts. I The role of the surface binding energy.
  • Investigation of preferential sputtering mechanisms by analysing the sample surface and near-surface region with AES and ISS.
  • High-fluence implantation in insulators. Part I: Compositional, mechanical, and optical changes.
  • High-fluence implantation in insulators. Part II: Chemical changes.
  • Electrochemical and corrosion behaviour of ion and laser-beam modified metal surfaces.
  • Structural Changes.
  • Ion-irradiation induced phase changes in metallic systems.
  • The topography of ion-bombarded surfaces.
  • Cultured blisters.
  • Electronic Changes.
  • Electronic properties of ion-implanted metals.
  • Mechanical Changes.
  • Tribology of implantation bilayers.
  • Adhesive and abrasive wear study of nitrogen implanted steels.
  • Effect of ?-recoil damage on the elastic moduli of zircon and tourmaline.
  • Depth-resolved investigation of structural transformations and hardness variations in implanted films on bulk samples.
  • Laser Processing.
  • Laser etching as an alternative.
  • Pulsed laser irradiation of heavily Ge implanted silicon.