Forces in Scanning Probe Methods

Inhaltsverzeichnis

• to Scanning Probe Methods.
• The Nanometer Age: Challenge and Chance.
• Instrumentation.
• Scanning Probe Microscopy Instrumentation.
• Low Temperature Scanning Force Microscopy.
• Measuring Ultrafast Voltage Signals Using a Scanning Force Microscope.
• Oscillating String as a Force Sensor in Scanning Force Microscopy.
• Electrostatically Actuated Silicon Micromachined Sensors for Scanning Force Microscopy.
• Effect of Overlayer Thickness on the Nanoindentation of SiO2 /Si.
• Nanostethoscopy: a New Mode of Operation of the Atomic Force Microscope.
• A Multi-Test Instrument Based on Scanning Probe Technologies.
• Hydrophobic Surface Interactions Studied Using a Novel Force Microscope.
• Imaging Loal Electric Forces in Organic Thin Films by Scanning Maxwell Stress Microscopy.
• Simultaneous AFM and Local Conductivity Imaging.
• Micromechanical Heat Sensor: Observation of a Chemical Reaction, Photon and Electrical Heat Pulses.
• Theory.
• Forces in Scanning Probe Microscopy.
• Controlled Motion of Xe Atom on Metal Surfaces.
• Van der Waals Forces and Probe Geometeries for Some Specific Scanning Force Microscopy Studies.
• Atomistic Theory of the Interaction between AFM Tips and Ionic Surfaces.
• Molecular Dynamics Simulation of Atomic-Scale Adhesion, Deformation, Friction, and Modification of Diamond Surfaces.
• Simulation of SFM Images of Adsorbed C60 and C70 Molecule.
• Metallic Adhesion.
• Atomic-Scale Metal Adhesion.
• Photons.
• Photons and Forces I: Light Generates Force.
• Photons and Forces II: Forces Influence Light.
• Friction.
• Interfacial Friction and Adhesion of Wetted Monolayers.
• Coherent Phonon Generation in the Process of Friction.
• Friction Force Microscopy.
• Molecular Scale Study of Domain Boundaries and Frictional Stick-Slip Motion on Lipid Bilayers.
• Two-Dimensional Atomic-ScaleFriction Observed with an AFM.
• Normal and Lateral Forces in Friction Force Microscopy.
• Nanotribology and Chemical Sensitivity on a Nanometer Scale.
• Lateral Force Measurements on Phase Separated Polymer Surfaces.
• Friction and Load on Well Defined Surfaces Studied by Atomic Force Microscopy.
• Friction on an Atomic Scale.
• Nano and Micromechanics.
• Nanomechanics: Atomic Resolution and Frictional Energy Dissipation in Atomic Force Microscopy.
• Nanotribology and its Applications to Magnetic Storage Devices and MEMS.
• Lifetime Criteria of Macro- and Microtribological Systems.
• Mechanical Property Evaluations of Solid Surfaces as a Technological Application of SPM.
• Effects of Boundary Lubricants and Metallic Oxides in Steel-Steel Tribological Junctions Studied with the Atomic Force Microscope.
• Magnetic Storage and Magnetic Forces.
• High-Density Recording Technologies as an Application of SPM.
• Applications of Magnetic Force Microscopy.
• Magnetic Force Microscopy on Thin Film Magnetic Recording Media.
• Analysis of Vortices in Superconductors by Scanning Probe Microscopy.
• Applications.
• Understanding Surface Chemical Processes in Environmental Contamination: New Applications for AFM.
• Force Microscopy of Heavy Ion Irradiated Materials.
• Atomic Force Microscopy as a Tool to Study Surface Roughness Effects In X-Ray Photoelectron Spectroscopy.
• Atomic-Resolution Image of GaAs (110) Surface with an Ultrahigh-Vacuum Atomic Force Microscope (UHV-AFM).
• Time dependence and its Spatial Distribution of Densely Contact-Electrified Electrons on a Thin Silicon Oxide.
• Giant Atomic Corrugations on Layered Dichalcogenides Investigated by AFM/LFM.
• Nanometer Scale Machining of Covalent Monolayers Investigated by Combined AFM/ LFM.
• Atomic Resolution Imaging of ReS2 by AFM/LFM.
• Ultra-High-Vacuum Atomic Force Microscopy in the Study of Model Catalysts.
• AFM in Liquids AFM Observations of Si (111) in Solutions.
• Atomic Scale Force Mapping with the Atomic Force Microscope.
• Organics and Biology.
• Imaging Chemical Bonds by SPM.
• Study of Thin Organic Films by Various Scanning Force Microscopes.
• Molecular Arrangement and Mechanical Stability of Self-Assembled Monolayers on Au (111) under Applied Load.
• Organic Interface Inspection by Scanning Force Microscopy.
• Atomic Force Microscopy of Biological Membranes: Current Possibilities and Prospects.
• Biomolecule Photoimmobilization: Application in Scanning Probe Microscopy.
• Measuring Molecular Adhesion with Force Microscopy.
• Author-index.
• Subject-index.