Reihe Frontiers in Electronic TestingF.P.M. Beenker × Testability Concepts for Digital ICsThe Macro Test ApproachF.P.M. BeenkerSpringer USeBook2012149,79 € Testability Concepts for Digital ICsThe Macro Test ApproachF.P.M. BeenkerSpringer USSoftcover2012160,49 € Testability Concepts for Digital ICsThe Macro Test ApproachF.P.M. BeenkerSpringer USHardcover1995160,49 €
