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Reihe Frontiers in Electronic Testing

Buchcover Timing Performance of Nanometer Digital Circuits Under Process Variations

Timing Performance of Nanometer Digital Circuits Under Process Variations

Springer International Publishing

Buchcover Timing Performance of Nanometer Digital Circuits Under Process Variations

Timing Performance of Nanometer Digital Circuits Under Process Variations

Springer International Publishing

Buchcover Timing Performance of Nanometer Digital Circuits Under Process Variations

Timing Performance of Nanometer Digital Circuits Under Process Variations

Springer International Publishing

Buchcover Advances in Electronic Testing

Advances in Electronic Testing

Challenges and Methodologies

Buchcover The Core Test Wrapper Handbook

The Core Test Wrapper Handbook

Rationale and Application of IEEE Std. 1500™

Francisco da Silva

Buchcover Defect Oriented Testing for CMOS Analog and Digital Circuits

Defect Oriented Testing for CMOS Analog and Digital Circuits

Buchcover Testing Static Random Access Memories

Testing Static Random Access Memories

Defects, Fault Models and Test Patterns

Buchcover High Performance Memory Testing

High Performance Memory Testing

Design Principles, Fault Modeling and Self-Test

Buchcover Design for AT-Speed Test, Diagnosis and Measurement

Design for AT-Speed Test, Diagnosis and Measurement

Buchcover SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Krishnendu Chakrabarty

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