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Reihe Frontiers in Electronic Testing

Buchcover Introduction to Advanced System-on-Chip Test Design and Optimization

Introduction to Advanced System-on-Chip Test Design and Optimization

Buchcover Fault Diagnosis of Analog Integrated Circuits

Fault Diagnosis of Analog Integrated Circuits

Prithviraj Kabisatpathy

Buchcover Analog and Mixed-Signal Boundary-Scan

Analog and Mixed-Signal Boundary-Scan

A Guide to the IEEE 1149.4 Test Standard

Buchcover Power-Constrained Testing of VLSI Circuits

Power-Constrained Testing of VLSI Circuits

A Guide to the IEEE 1149.4 Test Standard

Nicola Nicolici

Buchcover Testing Static Random Access Memories

Testing Static Random Access Memories

Defects, Fault Models and Test Patterns

Buchcover Data Mining and Diagnosing IC Fails

Data Mining and Diagnosing IC Fails

Leendert M. Huisman

Buchcover Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation

Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation

Buchcover Boundary-Scan Interconnect Diagnosis

Boundary-Scan Interconnect Diagnosis

José T. de Sousa

Buchcover Reasoning in Boolean Networks

Reasoning in Boolean Networks

Logic Synthesis and Verification Using Testing Techniques

Buchcover Verification by Error Modeling

Verification by Error Modeling

Using Testing Techniques in Hardware Verification

Katarzyna Radecka

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