Buchportal für Bücher die eine ISBN tragen.

Reihe Frontiers in Electronic Testing

Buchcover Power-Constrained Testing of VLSI Circuits

Power-Constrained Testing of VLSI Circuits

A Guide to the IEEE 1149.4 Test Standard

Nicola Nicolici

Buchcover Design for AT-Speed Test, Diagnosis and Measurement

Design for AT-Speed Test, Diagnosis and Measurement

Buchcover Introduction to Advanced System-on-Chip Test Design and Optimization

Introduction to Advanced System-on-Chip Test Design and Optimization

Buchcover Advances in Electronic Testing

Advances in Electronic Testing

Challenges and Methodologies

Buchcover Advances in Electronic Testing

Advances in Electronic Testing

Challenges and Methodologies

Buchcover Fault Diagnosis of Analog Integrated Circuits

Fault Diagnosis of Analog Integrated Circuits

Prithviraj Kabisatpathy

Buchcover High Performance Memory Testing

High Performance Memory Testing

Design Principles, Fault Modeling and Self-Test

Buchcover Boundary-Scan Interconnect Diagnosis

Boundary-Scan Interconnect Diagnosis

José T. de Sousa

Buchcover A Designer’s Guide to Built-In Self-Test

A Designer’s Guide to Built-In Self-Test

Charles E. Stroud

Buchcover Verification by Error Modeling

Verification by Error Modeling

Using Testing Techniques in Hardware Verification

Katarzyna Radecka

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