Reihe Frontiers in Electronic Testing

Delay Fault Testing for VLSI Circuits

Introduction to IDDQ Testing

Testability Concepts for Digital ICs

Multi-Chip Module Test Strategies

Formal Equivalence Checking and Design Debugging

Models in Hardware Testing

Embedded Processor-Based Self-Test

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Efficient Branch and Bound Search with Application to Computer-Aided Design

From Contamination to Defects, Faults and Yield Loss