Reihe Frontiers in Electronic Testing

Multi-Chip Module Test Strategies

Formal Equivalence Checking and Design Debugging

Embedded Processor-Based Self-Test

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Efficient Branch and Bound Search with Application to Computer-Aided Design

From Contamination to Defects, Faults and Yield Loss

Introduction to Advanced System-on-Chip Test Design and Optimization

Fault Diagnosis of Analog Integrated Circuits

Analog and Mixed-Signal Boundary-Scan

Power-Constrained Testing of VLSI Circuits