Reihe Frontiers in Electronic Testing

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

A Designer’s Guide to Built-In Self-Test

Embedded Processor-Based Self-Test

Reasoning in Boolean Networks

Analog and Mixed-Signal Boundary-Scan

On-Line Testing for VLSI

Test Resource Partitioning for System-on-a-Chip

Efficient Branch and Bound Search with Application to Computer-Aided Design

From Contamination to Defects, Faults and Yield Loss

Elements of STIL