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Reihe Frontiers in Electronic Testing

Buchcover Reasoning in Boolean Networks

Reasoning in Boolean Networks

Logic Synthesis and Verification Using Testing Techniques

Buchcover Analog and Mixed-Signal Boundary-Scan

Analog and Mixed-Signal Boundary-Scan

A Guide to the IEEE 1149.4 Test Standard

Buchcover On-Line Testing for VLSI

On-Line Testing for VLSI

Buchcover Test Resource Partitioning for System-on-a-Chip

Test Resource Partitioning for System-on-a-Chip

Buchcover Efficient Branch and Bound Search with Application to Computer-Aided Design

Efficient Branch and Bound Search with Application to Computer-Aided Design

Buchcover From Contamination to Defects, Faults and Yield Loss

From Contamination to Defects, Faults and Yield Loss

Simulation and Applications

Jitendra B. Khare

Buchcover Elements of STIL

Elements of STIL

Principles and Applications of IEEE Std. 1450

Gregory A. Maston

Buchcover Testability Concepts for Digital ICs

Testability Concepts for Digital ICs

The Macro Test Approach

Buchcover Research Perspectives and Case Studies in System Test and Diagnosis

Research Perspectives and Case Studies in System Test and Diagnosis

Buchcover Delay Fault Testing for VLSI Circuits

Delay Fault Testing for VLSI Circuits

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