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Reihe Frontiers in Electronic Testing

Buchcover On-Line Testing for VLSI

On-Line Testing for VLSI

Buchcover Fault-Tolerance Techniques for SRAM-Based FPGAs

Fault-Tolerance Techniques for SRAM-Based FPGAs

Fernanda Lima Kastensmidt

Buchcover Digital Timing Measurements

Digital Timing Measurements

From Scopes and Probes to Timing and Jitter

Wolfgang Maichen

Buchcover Emerging Nanotechnologies

Emerging Nanotechnologies

Test, Defect Tolerance, and Reliability

Buchcover Oscillation-Based Test in Mixed-Signal Circuits

Oscillation-Based Test in Mixed-Signal Circuits

Gloria Huertas Sánchez

Springer Netherland

Buchcover Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Buchcover CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Process-Aware SRAM Design and Test

Springer Netherland

Buchcover New Methods of Concurrent Checking

New Methods of Concurrent Checking

Michael Gössel

Springer Netherland

Buchcover Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems

Buchcover Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems

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