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Reihe Frontiers in Electronic Testing

Buchcover Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Buchcover Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems

Buchcover Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems

Buchcover Emerging Nanotechnologies

Emerging Nanotechnologies

Test, Defect Tolerance, and Reliability

Buchcover Emerging Nanotechnologies

Emerging Nanotechnologies

Test, Defect Tolerance, and Reliability

Buchcover Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Buchcover Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Buchcover Fault-Tolerance Techniques for SRAM-Based FPGAs

Fault-Tolerance Techniques for SRAM-Based FPGAs

Fernanda Lima Kastensmidt

Buchcover Digital Timing Measurements

Digital Timing Measurements

From Scopes and Probes to Timing and Jitter

Wolfgang Maichen

Buchcover Data Mining and Diagnosing IC Fails

Data Mining and Diagnosing IC Fails

Leendert M. Huisman

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