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Reihe Frontiers in Electronic Testing

Buchcover Testability Concepts for Digital ICs

Testability Concepts for Digital ICs

The Macro Test Approach

Buchcover Research Perspectives and Case Studies in System Test and Diagnosis

Research Perspectives and Case Studies in System Test and Diagnosis

Buchcover Delay Fault Testing for VLSI Circuits

Delay Fault Testing for VLSI Circuits

Buchcover Formal Equivalence Checking and Design Debugging

Formal Equivalence Checking and Design Debugging

Buchcover Multi-Chip Module Test Strategies

Multi-Chip Module Test Strategies

Buchcover Introduction to IDDQ Testing

Introduction to IDDQ Testing

Buchcover Test Resource Partitioning for System-on-a-Chip

Test Resource Partitioning for System-on-a-Chip

Buchcover Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems

Buchcover Elements of STIL

Elements of STIL

Principles and Applications of IEEE Std. 1450

Gregory A. Maston

Buchcover Research Perspectives and Case Studies in System Test and Diagnosis

Research Perspectives and Case Studies in System Test and Diagnosis

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