Reihe Frontiers in Electronic Testing

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

High Performance Memory Testing

Test Resource Partitioning for System-on-a-Chip

A Designer’s Guide to Built-In Self-Test

Boundary-Scan Interconnect Diagnosis

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Analog and Mixed-Signal Boundary-Scan

Design for AT-Speed Test, Diagnosis and Measurement

Delay Fault Testing for VLSI Circuits

Research Perspectives and Case Studies in System Test and Diagnosis