Buchportal für Bücher die eine ISBN tragen.

Reihe Frontiers in Electronic Testing

Buchcover Testing Static Random Access Memories

Testing Static Random Access Memories

Defects, Fault Models and Test Patterns

Buchcover Data Mining and Diagnosing IC Fails

Data Mining and Diagnosing IC Fails

Leendert M. Huisman

Buchcover Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation

Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation

Buchcover Boundary-Scan Interconnect Diagnosis

Boundary-Scan Interconnect Diagnosis

José T. de Sousa

Buchcover Reasoning in Boolean Networks

Reasoning in Boolean Networks

Logic Synthesis and Verification Using Testing Techniques

Buchcover Verification by Error Modeling

Verification by Error Modeling

Using Testing Techniques in Hardware Verification

Katarzyna Radecka

Buchcover On-Line Testing for VLSI

On-Line Testing for VLSI

Buchcover Fault-Tolerance Techniques for SRAM-Based FPGAs

Fault-Tolerance Techniques for SRAM-Based FPGAs

Fernanda Lima Kastensmidt

Buchcover Digital Timing Measurements

Digital Timing Measurements

From Scopes and Probes to Timing and Jitter

Wolfgang Maichen

Buchcover Emerging Nanotechnologies

Emerging Nanotechnologies

Test, Defect Tolerance, and Reliability

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