Reihe Frontiers in Electronic TestingManoj Sachdev × Defect Oriented Testing for CMOS Analog and Digital Circuits Manoj SachdevSpringer USeBook201385,59 € Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits Manoj SachdevSpringer USSoftcover2010213,99 € Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits Manoj SachdevSpringer USHardcover2007213,99 € Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits Manoj SachdevSpringer USeBook2007213,99 €
