Buchportal für Bücher die eine ISBN tragen.

Reihe Frontiers in Electronic Testing

Buchcover Timing Performance of Nanometer Digital Circuits Under Process Variations

Timing Performance of Nanometer Digital Circuits Under Process Variations

Springer International Publishing

Buchcover Defect Oriented Testing for CMOS Analog and Digital Circuits

Defect Oriented Testing for CMOS Analog and Digital Circuits

Buchcover Testing Static Random Access Memories

Testing Static Random Access Memories

Defects, Fault Models and Test Patterns

Buchcover SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Krishnendu Chakrabarty

Buchcover Embedded Processor-Based Self-Test

Embedded Processor-Based Self-Test

Dimitris Gizopoulos

Buchcover Reasoning in Boolean Networks

Reasoning in Boolean Networks

Logic Synthesis and Verification Using Testing Techniques

Buchcover Analog and Mixed-Signal Boundary-Scan

Analog and Mixed-Signal Boundary-Scan

A Guide to the IEEE 1149.4 Test Standard

Buchcover On-Line Testing for VLSI

On-Line Testing for VLSI

Buchcover Efficient Branch and Bound Search with Application to Computer-Aided Design

Efficient Branch and Bound Search with Application to Computer-Aided Design

Buchcover Test Resource Partitioning for System-on-a-Chip

Test Resource Partitioning for System-on-a-Chip

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