Buchportal für Bücher die eine ISBN tragen.

Reihe Frontiers in Electronic Testing

Buchcover Timing Performance of Nanometer Digital Circuits Under Process Variations

Timing Performance of Nanometer Digital Circuits Under Process Variations

Springer International Publishing

Buchcover Timing Performance of Nanometer Digital Circuits Under Process Variations

Timing Performance of Nanometer Digital Circuits Under Process Variations

Springer International Publishing

Buchcover Advances in Electronic Testing

Advances in Electronic Testing

Challenges and Methodologies

Buchcover The Core Test Wrapper Handbook

The Core Test Wrapper Handbook

Rationale and Application of IEEE Std. 1500™

Francisco da Silva

Buchcover High Performance Memory Testing

High Performance Memory Testing

Design Principles, Fault Modeling and Self-Test

Buchcover Design for AT-Speed Test, Diagnosis and Measurement

Design for AT-Speed Test, Diagnosis and Measurement

Buchcover Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Buchcover A Designer’s Guide to Built-In Self-Test

A Designer’s Guide to Built-In Self-Test

Charles E. Stroud

Buchcover Test Resource Partitioning for System-on-a-Chip

Test Resource Partitioning for System-on-a-Chip

Buchcover Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems

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