Reihe Frontiers in Electronic TestingR. Dean Adams × High Performance Memory TestingDesign Principles, Fault Modeling and Self-TestR. Dean AdamsSpringer USSoftcover2013160,49 € High Performance Memory TestingDesign Principles, Fault Modeling and Self-TestR. Dean AdamsSpringer USeBook2005149,79 € High Performance Memory TestingDesign Principles, Fault Modeling and Self-TestR. Dean AdamsSpringer USHardcover2002160,49 €
