Reihe Frontiers in Electronic TestingSpringer Netherland × Models in Hardware TestingLecture Notes of the Forum in Honor of Christian LandraultSpringer NetherlandSoftcover2012106,99 € Oscillation-Based Test in Mixed-Signal Circuits Gloria Huertas SánchezSpringer NetherlandSoftcover2010160,49 € CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled TechnologiesProcess-Aware SRAM Design and TestAndrei PavlovSpringer NetherlandSoftcover2010171,19 € New Methods of Concurrent Checking Michael GösselSpringer NetherlandSoftcover2010106,99 € Models in Hardware TestingLecture Notes of the Forum in Honor of Christian LandraultSpringer NetherlandHardcover2009106,99 € Models in Hardware TestingLecture Notes of the Forum in Honor of Christian LandraultSpringer NetherlandeBook200996,29 € CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled TechnologiesProcess-Aware SRAM Design and TestAndrei PavlovSpringer NetherlandHardcover2008171,19 € CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled TechnologiesProcess-Aware SRAM Design and TestAndrei PavlovSpringer NetherlandeBook2008160,49 € New Methods of Concurrent Checking Michael GösselSpringer NetherlandHardcover2008106,99 € New Methods of Concurrent Checking Michael GösselSpringer NetherlandeBook200896,29 €12 Treffer 1 2
