Reihe Frontiers in Electronic TestingLeendert M. Huisman ×Springer US × Data Mining and Diagnosing IC Fails Leendert M. HuismanSpringer USSoftcover2010106,99 € Data Mining and Diagnosing IC Fails Leendert M. HuismanSpringer USeBook200696,29 € Data Mining and Diagnosing IC Fails Leendert M. HuismanSpringer USHardcover2005106,99 €
