Reihe Frontiers in Electronic TestingNicola Nicolici × Power-Constrained Testing of VLSI CircuitsA Guide to the IEEE 1149.4 Test StandardNicola NicoliciSpringer USSoftcover2010106,99 € Power-Constrained Testing of VLSI CircuitsA Guide to the IEEE 1149.4 Test StandardNicola NicoliciSpringer USeBook200696,29 € Power-Constrained Testing of VLSI CircuitsA Guide to the IEEE 1149.4 Test StandardNicola NicoliciSpringer USHardcover2003106,99 €