Reihe Frontiers in Electronic Testing

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Analog and Mixed-Signal Boundary-Scan

Design for AT-Speed Test, Diagnosis and Measurement

Delay Fault Testing for VLSI Circuits

Research Perspectives and Case Studies in System Test and Diagnosis

Formal Equivalence Checking and Design Debugging

On-Line Testing for VLSI

Reasoning in Boolean Networks

Introduction to IDDQ Testing

Multi-Chip Module Test Strategies