Buchportal für Bücher die eine ISBN tragen.

Reihe Frontiers in Electronic Testing

Buchcover The Core Test Wrapper Handbook

The Core Test Wrapper Handbook

Rationale and Application of IEEE Std. 1500™

Francisco da Silva

Buchcover Digital Timing Measurements

Digital Timing Measurements

From Scopes and Probes to Timing and Jitter

Wolfgang Maichen

Buchcover The Core Test Wrapper Handbook

The Core Test Wrapper Handbook

Rationale and Application of IEEE Std. 1500™

Francisco da Silva

Buchcover Fault-Tolerance Techniques for SRAM-Based FPGAs

Fault-Tolerance Techniques for SRAM-Based FPGAs

Fernanda Lima Kastensmidt

Buchcover Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Buchcover Design for AT-Speed Test, Diagnosis and Measurement

Design for AT-Speed Test, Diagnosis and Measurement

Buchcover Power-Constrained Testing of VLSI Circuits

Power-Constrained Testing of VLSI Circuits

A Guide to the IEEE 1149.4 Test Standard

Nicola Nicolici

Buchcover Introduction to Advanced System-on-Chip Test Design and Optimization

Introduction to Advanced System-on-Chip Test Design and Optimization

Buchcover Advances in Electronic Testing

Advances in Electronic Testing

Challenges and Methodologies

Buchcover Advances in Electronic Testing

Advances in Electronic Testing

Challenges and Methodologies

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