Reihe Frontiers in Electronic Testing

Fault Diagnosis of Analog Integrated Circuits

High Performance Memory Testing

Boundary-Scan Interconnect Diagnosis

A Designer’s Guide to Built-In Self-Test

Verification by Error Modeling

Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation

Fault Diagnosis of Analog Integrated Circuits

Introduction to Advanced System-on-Chip Test Design and Optimization

Data Mining and Diagnosing IC Fails

Embedded Processor-Based Self-Test