Reihe SpringerBriefs in Reliability CMOS RF Circuit Design for Reliability and Variability Jiann-Shiun YuanSpringer SingaporeSoftcover201653,49 € CMOS RF Circuit Design for Reliability and Variability Jiann-Shiun YuanSpringer SingaporeeBook201653,49 € Electromigration Modeling at Circuit Layout Level Cher Ming TanSpringer SingaporeSoftcover201353,49 € Electromigration Modeling at Circuit Layout Level Cher Ming TanSpringer SingaporeeBook201353,49 €
